Browsing by Author "Radhakrishnan, Govindakrishnan"
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Improved Fault Tolerant SRAM Cell Design & Layout in 130nm Technology
Radhakrishnan, Govindakrishnan (2014-08-14)Technology scaling of CMOS devices has made the integrated circuits vulnerable to single event radiation effects. Scaling of CMOS Static RAM (SRAM) has led to denser packing architectures by reducing the size and spacing ...