Now showing items 1-2 of 2

    • EX SITU STUDY OF THE EPITAXIAL GROWTH OF N-ALKANE THIN FILMS 

      Senger, Curtis 1989-; 0000-0002-1891-4965 (2017-02-21)
      A thorough understanding of the growth mechanism in organic thin film growth is necessary to be able to develop devices based on these materials. In particular, there are open questions about the growth mechanism of ...
    • Linear dichroism in the NEXAFS spectroscopy of n-alkane thin films 

      Fu, Juxia (2006-09-25)
      Linear dichroism in Near Edge X-ray Absorption Fine Structure (NEXAFS) spectroscopy has been used to determine molecular orientation at surfaces and in microscopic domains. However, the molecular orientation of n-alkanes ...