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    • XPS and EELS characterization of Mn2SiO4, MnSiO3 and MnAl2O4 

      Grosvenor, Andrew; Bellhouse, Erika; Korinek, A.; Bugnet, M.; McDermid, Joseph (Elsevier, 2016)
      X-ray Photoelectron Spectroscopy (XPS) and Electron Energy Loss Spectroscopy (EELS) are strong candi- date techniques for characterizing steel surfaces and substrate-coating interfaces when investigating the selective ...