Now showing items 1-6 of 6
Systematic Investigation of π–π Interactions in Near-Edge X-ray Fine Structure (NEXAFS) Spectroscopy of Paracyclophanes
NEXAFS spectroscopy has potential for study of packing and order in organic materials but only if intermolecular effects are understood. This work studies how π–π interactions between adjacent unsaturated groups affect ...
Silicon 1s Near Edge X-ray Absorption Fine Structure Spectroscopy of Functionalized Silicon Nanocrystals
(American Chemical Society, 2016)
Silicon 1s Near Edge X-ray Absorption Fine Structure (NEXAFS) spectra of silicon nanocrystals have been examined as a function of nanocrystal size (3 – 100 nm), varying surface functionalization (hydrogen or 1-pentyl ...
Linear Dichroism in the NEXAFS Spectra of n-Alkane Crystalline Polymorphs
Linear Dichroism in Near Edge X-ray Absorption Fine Structure (NEXAFS) spectroscopy is a useful tool for studying molecular orientation and for clarifying spectroscopic assignments. n- Alkane molecules can form single ...
Temperature Dependence in the NEXAFS Spectra of n-Alkane
(American Chemical Society, 2018-11-16)
The near edge X-ray absorption fine structure (NEXAFS) spectra of orthorhombic single crystals of n-octacosane (n-C28H58), recorded at room temperature (298 K) and at cryogenic temperatures (93 K), show distinct differences. ...
Connecting Molecular Conformation to Aggregation in P3HT Using Near Edge X-ray Absorption Fine Structure Spectroscopy
(American Chemical Society, 2017-10-11)
Carbon 1s Near Edge X-ray Absorption Fine Structure (NEXAFS) and UV-vis spectroscopy are used to examine differences between highly aggregated and poorly aggregated forms of the polymer poly(3-hexylthiophene) (P3HT), based ...
Internal molecular conformation of organic glasses: A NEXAFS study
(American Institute of Physics, 2021-07-16)
The origin of the exceptional stability of molecular glasses grown by physical vapor deposition (PVD) is not well understood. Differences in glass density have been correlated with thermodynamic stability for thin films ...