XPS and EELS characterization of Mn2SiO4, MnSiO3 and MnAl2O4
Date
2016
Authors
Grosvenor, Andrew
Bellhouse, Erika
Korinek, A.
Bugnet, M.
McDermid, Joseph
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Elsevier
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Article
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Abstract
X-ray Photoelectron Spectroscopy (XPS) and Electron Energy Loss Spectroscopy (EELS) are strong candi- date techniques for characterizing steel surfaces and substrate-coating interfaces when investigating the selective oxidation and reactive wetting of advanced high strength steels (AHSS) during the continuous galvanizing process. However, unambiguous identification of ternary oxides such as Mn2SiO4, MnSiO3, and MnAl2O4 by XPS or EELS, which can play a significant role in substrate reactive wetting, is difficult due to the lack of fully characterized standards in the literature. To resolve this issue, samples of Mn2 SiO4 , MnSiO3 and MnAl2O4 were synthesized and characterized by XPS and EELS. The unique features of the XPS and EELS spectra for the Mn2 SiO4 , MnSiO3 and MnAl2 O4 standards were successfully derived, thereby allowing investigators to fully differentiate and identify these oxides at the surface and subsurface of Mn, Si and Al alloyed AHSS using these techniques.
Description
Keywords
X-ray photoelectron spectroscopy, Electron energy loss spectroscopy, Selective oxidation, Manganese silicates, Manganese aluminates
Citation
Applied Surface Science 379 (2016) 242–248
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Citation
Applied Surface Science 379 (2016) 242–248