Design of a high performance soft x-ray emission spectrometer for the REIXS beamline at the Canadian Light Source

Abstract

The optical design of a soft X-ray (90-1100~eV) emission spectrometer for the Resonant Elastic and Inelastic X-ray Scattering (REIXS) beamline to be implemented at the CLS is presented. An overview of soft X-ray optical theory as it relates to diffraction gratings is given. The initial constraints and the process that led to this design are outlined. Techniques and software tools that were developed, using ray-tracing and diffraction grating efficiency calculations, are discussed. The analysis completed with these tools to compare existing soft X-ray emission spectrometer designs is presented. Based on this analysis, a new design with superior performance for this application is proposed and reviewed. This design employs Rowland circle geometry to achieve a resolving power in excess of 2,500 in the range of interest. In addition, a novel design is proposed for a larger extremely high resolution spectrometer which will provide resolving powers exceeding 10,000 throughout the higher end of this range. A review is given of research into the components, manufacturing techniques and tolerances that will be required to produce this spectrometer.