Excess Noise in Vanadium Dioxide Thin Films
dc.contributor.advisor | Johanson, Robert | |
dc.contributor.advisor | Kasap, Safa | |
dc.contributor.committeeMember | Teng, Daniel | |
dc.contributor.committeeMember | Chen, Li | |
dc.contributor.committeeMember | Bradley, Michael | |
dc.creator | Onumonu, Buchi Israel | |
dc.date.accessioned | 2024-05-29T17:36:59Z | |
dc.date.copyright | 2024 | |
dc.date.created | 2024-05 | |
dc.date.issued | 2024-05-29 | |
dc.date.submitted | May 2024 | |
dc.date.updated | 2024-05-29T17:36:59Z | |
dc.description.abstract | This item is under an embargo. Access to the abstract will not be permitted until 2025-05-29 | |
dc.format.mimetype | application/pdf | |
dc.identifier.uri | https://hdl.handle.net/10388/15730 | |
dc.language.iso | en | |
dc.subject | Flicker noise | |
dc.subject | vanadium dioxide | |
dc.subject | VO2 | |
dc.subject | electronic noise | |
dc.subject | noise | |
dc.subject | metal to insulator transition | |
dc.subject | phase change material | |
dc.subject | phase change | |
dc.subject | MIT | |
dc.subject | IMT | |
dc.title | Excess Noise in Vanadium Dioxide Thin Films | |
dc.type | Thesis | |
dc.type.material | text | |
local.embargo.lift | 2025-05-29 | |
local.embargo.terms | 2025-05-29 | |
thesis.degree.department | Electrical and Computer Engineering | |
thesis.degree.discipline | Electrical Engineering | |
thesis.degree.grantor | University of Saskatchewan | |
thesis.degree.level | Masters | |
thesis.degree.name | Master of Science (M.Sc.) |