Statistics for Characterization of Ion Implanted Materials for Photonic Applications: Radiation Damage in Tellurium Dioxide and Silicon LEDs
Total visits
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| Characterization of Ion Implanted Materials for Photonic Applications: Radiation Damage in Tellurium Dioxide and Silicon LEDs | 14 |
Total visits per month
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| January 2025 | 1 |
| February 2025 | 2 |
| March 2025 | 2 |
| April 2025 | 1 |
| May 2025 | 1 |
| June 2025 | 0 |
| July 2025 | 0 |
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| ELCOCK-DISSERTATION-2024.pdf | 136 |
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| Canada | 4 |
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| Nangar | 4 |
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