Making chemical sense of phase in soft X-ray spectroptychography
Date
7/12/2023
Authors
Joseph, Stitsky
Jian, Wang
Stephen, Urquhart
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Publisher
Elsevier
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Article
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Abstract
Spectroptychography is being used to realize a significant improvement in the spatial resolution of x-ray spectromicroscopy, allowing chemical microanalysis at finer spatial scales. The chemical sensitivity of near edge X-ray absorption fine structure (NEXAFS) is familiar to most researchers who use x-ray spectromicroscopy for chemical microanalysis. However, the additional phase information available through ptychography provides additional and tantalizing data, and potentially additional chemical information. This paper explores the chemical information available in phase for a system of silicon dioxide nanospheres.
Description
Keywords
Spectroptychography, NEXAFS, X-ray microscopy, Phase spectroscopy, Chemical imaging
Citation
Stitsky, J., Wang, J, & Urquhart, S.G. (2023) Making chemical sense of phase in soft X-ray spectroptychography. Journal of Electron Spectroscopy and Related Phenomena, 267, 147367.
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Citation
Stitsky, J., Wang, J, & Urquhart, S.G. (2023) Making chemical sense of phase in soft X-ray spectroptychography. Journal of Electron Spectroscopy and Related Phenomena, 267, 147367.
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DOI
10.1016/j.elspec.2023.147367