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A Soft X-Ray Emission Endstation for the Canadian Light Source

dc.contributor.advisorMoewes, Alexen_US
dc.contributor.committeeMemberKycia, Stefanen_US
dc.contributor.committeeMemberChapman, Deanen_US
dc.contributor.committeeMemberTse, Johnen_US
dc.contributor.committeeMemberChang, Gap Sooen_US
dc.creatorMuir, Daviden_US
dc.date.accessioned2014-01-21T19:01:26Z
dc.date.available2014-01-21T19:01:26Z
dc.date.created2013-10en_US
dc.date.issued2013-10-30en_US
dc.date.submittedOctober 2013en_US
dc.description.abstractBased on a previously completed design for a soft X-ray (50-1100 eV) emission spectrometer, an endstation was constructed for the Resonant Elastic and Inelastic X-ray Scattering (REIXS) beamline at the CLS. The optical design employed techniques and software tools developed in-house using ray-tracing and diffraction grating efficiency calculations to analyze and compare existing designs and to propose a new design with superior performance. This design employs Rowland circle geometry to achieve a theoretical resolving power in excess of 2,500 in our range of interest. In addition, a novel optical design for a larger extremely high resolution spectrometer has been completed to provide theoretical resolving powers exceeding 10,000 throughout the higher end of the spectrum. To accommodate this optical design a completely new mechanical design was required, involving significant mechanical, electrical, vacuum and software engineering. Countless custom fabricated parts were required along with numerous o -the-shelf secondary instruments and systems. All told, this entirely student-managed project has cost over $1.5M and taken over 5 years. Construction is finally complete and the endstation is currently being commissioned. Necessary design changes made during the mechanical design process resulting in the selection of a more suitable, but lower resolution, detector. This reduced the theoretical maximum resolving power to 1,800 for the first order gratings and roughly 5,000 for the third order gratings. Commissioning is still underway, but first order resolutions in the range of 1,000 - 2,000 have been recorded as have third order resolutions exceeding 4,000. Publication quality data has been collecting by members of this research group and invited external users have successfully grown and measured samples here. Two of the optical elements required rework and upon their delivery the system commissioning will be completed and peer-reviewed access will begin.en_US
dc.identifier.urihttp://hdl.handle.net/10388/ETD-2013-10-1262en_US
dc.language.isoengen_US
dc.subjectsoft X-rayen_US
dc.subjectemissionen_US
dc.subjectspectroscopyen_US
dc.subjectendstationen_US
dc.subjectCLSen_US
dc.subjectCanadian Light Sourceen_US
dc.subjectREIXSen_US
dc.subjectXESen_US
dc.subjectXASen_US
dc.subjectRIXSen_US
dc.subjectNEXAFSen_US
dc.subjectXANESen_US
dc.subjectVacuumen_US
dc.subjectUHVen_US
dc.titleA Soft X-Ray Emission Endstation for the Canadian Light Sourceen_US
dc.type.genreThesisen_US
dc.type.materialtexten_US
thesis.degree.departmentPhysics and Engineering Physicsen_US
thesis.degree.disciplinePhysicsen_US
thesis.degree.grantorUniversity of Saskatchewanen_US
thesis.degree.levelDoctoralen_US
thesis.degree.nameDoctor of Philosophy (Ph.D.)en_US

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