Silicon 1s Near Edge X-ray Absorption Fine Structure Spectroscopy of Functionalized Silicon Nanocrystals
Date
2016
Authors
Ritchie, Andrew
Cao, Wei
Dasog, Mita
Purkait, T.K.
Senger, Curtis
HU, Yongfeng
Xiao, Q.F.
Veinot, Jon
Urquhart, Stephen
Urquhart, Stephen
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Publisher
American Chemical Society
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Article
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Abstract
Silicon 1s Near Edge X-ray Absorption Fine Structure (NEXAFS) spectra of silicon nanocrystals have been examined as a function of nanocrystal size (3 – 100 nm), varying surface functionalization (hydrogen or 1-pentyl termination), or embedded in oxide. The NEXAFS spectra are characterized as a function of nanocrystal size and surface functionalization. Clear spectroscopic evidence for long range order is observed Si-NCs that are 5-8 nm in diameter or larger. Energy shifts in the silicon 1s NEXAFS spectra of covalently functionalized silicon nanocrystals with changing size are attributed to surface chemical shifts and not to quantum confinement effects.
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Citation
A. Ritchie, W. Cao, M. Dasog, T.K. Purkait, C. Senger, Y.F. Hu, Q.F. Xiao, J.G.C. Veinot and S.G. Urquhart, 2016. Silicon 1s near edge X-ray absorption fine structure spectroscopy of functionalized silicon nanocrystals.The Journal of Chemical Physics, 145, 154703.
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Citation
A. Ritchie, W. Cao, M. Dasog, T.K. Purkait, C. Senger, Y.F. Hu, Q.F. Xiao, J.G.C. Veinot and S.G. Urquhart, 2016. Silicon 1s near edge X-ray absorption fine structure spectroscopy of functionalized silicon nanocrystals.The Journal of Chemical Physics, 145, 154703.
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DOI
10.1063/1.4964371